The FEI Versa 3D Dual Beam offers imaging to deliver a greater range of 3D data from the most challenging samples. Work with a range of samples including uncoated, non-conductive samples. The environmental mode allows imaging of naturally hydrated samples and supports in situ analysis of materials in their natural state and experimentation with additional dynamic temperature stages for researching physical phenomena, nanoparticle interaction and nanostructure self-assembly. You can examine how materials are interconnected and what properties are important in developing next-generation products.
Whether analysing using (Scanning) Transmission Electron Microscopy, atomic probe microscopy, hot stage and tensile test experiments, Electron Backscatter Diffraction Analysis, or sub-surface feature metrology, it combines the site-specificity inherent to using Focused Ion Beam (FIB), with software routines for ease of use and automation. This provides a powerful platform to quickly and confidently produce the highest quality samples.