X-ray diffraction (XRD) is an ideal, non-destructive analytical method for examining all types of (semi-)crystalline samples.
The newest equipment features alignment- and tool-free switching, with add-on possibilities for:
XRD at various temperatures (-190°C to 1600°C) / In-plane graze-incidence X-ray diffraction / X-ray reflectometry
It offers a greatly improved low detection limit. One can obtain information of the sample on e.g.:
Phase identification/ Phase composition/ Crystal structure/ Microstructure